Laser wavelength metrology with color sensor chips.
نویسندگان
چکیده
We present a laser wavelength meter based on a commercial color sensor chip. The chip consists of an array of photodiodes with different absorptive color filters. By comparing the relative amplitudes of light on the photodiodes, the wavelength of light can be determined. In addition to absorption in the filters, etalon effects add additional spectral features which improve the precision of the device. Comparing the measurements from the device to a commercial wavelength meter and to an atomic reference, we found that the device has picometer-level precision and picometer-scale drift over a period longer than a month.
منابع مشابه
Glucose-Sensitive Holographic (Bio)Sensors: Fundamentals and Applications
Nowadays sensors and especially biosensors play an important role in medical diagnosis and detection of food and environment contaminations. Biosensors’ facilities have been improved significantly by using technologies such as surface plasmon resonance, microfluidics, laser, and electrochemistry. These technologies are now available on chips in micro- and nano-scale and are capable of mea...
متن کاملInfrared Holography for Wavefront Reconstruction and Interferometric Metrology
Long wavelength interferometry has been widely applied in different fields, such as infrared optics, infrared transmitting materials, high-reflective multilayer dielectric coatings for highpower laser systems. In optical metrology, long-wave interferometers are also employed for shape measurement of reflective rough surfaces and for testing optical systems that requires deep aspherics. An advan...
متن کاملGlucose-Sensitive Holographic (Bio)Sensors: Fundamentals and Applications
owadays sensors and especially biosensors play an important role in medical diagnosis and detection of food and environment contaminations. Biosensors’ facilities have been improved significantly by using technologies such as surface plasmon resonance, microfluidics, laser, and electrochemistry. These technologies are now available on chips in microand nano-scale and are capable of measuring th...
متن کاملFundamental limits in fiber Bragg grating peak wavelength measurements
We discuss the fundamental limits of fiber Bragg grating (FBG) wavelength metrology. High-accuracy wavelength measurements are critical for FBG strain sensors because a wavelength measurement uncertainty as small as 1 pm leads to an uncertainty of nearly 1 microstrain. We compare the measurement uncertainties for several common wavelengthmeasurement systems, including tunable laser, optical spe...
متن کاملHigh Precision Dimensional Metrology of Periodic Nanostructures using Laser Scatterometry
At PTB different laser scatterometers with partly novel and outstanding metrological capabilities have been developed and are available for high-resolution dimensional metrology of periodic nanostructures. Two different systems are described and their metrological potential discussed: a laser diffractometer for pitch calibration and a versatile goniometric scatterometer for multi-parameter char...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Optics express
دوره 23 25 شماره
صفحات -
تاریخ انتشار 2015